1887

Abstract

Titanium dioxide (TiO2) films have been prepared by sol-gel dip coating technique, using titanium isopropoxide (TIP) as precursors. The structure and the phase of TiO2 films were analyzed by x-ray diffraction (XRD) and showed that films were anatase. Optical properties of the films were characterized by ultraviolet-visible (UV) spectroscopy. The optical band gap was calculated for anatase film layers 50, 100, 150 and 200nm as 3.95, 3.87, 3.75 and 3.70eV, respectively. The refractive index of these films was computed by ellipsometry which were in range from 1.9 to 2.3 at a wavelength range from 380 to 600nm. The thickness of the films was obtained from ellipsometry as of 58nm per one dip. The surface of TiO2 thin films were investigated by sanning electron micropscpe (SEM). The images obtained by SEM show cracks and shrinkage particles in the film. Whereas, the images obtained by atomic force microscope (AFM) showed a homogeneous distribution of elongated shapes of nanoparticles through the film. In addition, the composition of TiO2 thin films checked via energy dispersive spectrometer (EDS), which found small amount of Ti. The results showed that anatase titania (TiO2) nanomaterials have a promised potential for applications in solar cells.

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/content/papers/10.5339/qfarc.2014.EEPP1167
2014-11-18
2020-04-01
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http://instance.metastore.ingenta.com/content/papers/10.5339/qfarc.2014.EEPP1167
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